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Laborotory of
Diffusion and Defect
Formation in Semiconductors

Ioffe Institute

  • Home
  • Staff
    • M.V. Zamoryanskaya
    • Gennadiy S.Kulikov
    • Tatiana B.Popova
    • E.V. Ivanova
    • A.N. Trofimov
    • D.B. Shustov
    • K.N. Orekhova
    • A.Yu. Mester
    • V.A. Kravetc
    • A.D. Chegodaev
  • Teaching
  • Collaboration
  • Events
  • Publications

Events

Scientific meetings organized by the team:

  • 8th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2006)
  • 33rd International Symposium «Scientific Basis for Nuclear Waste Management” (2009)
  • 11th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (2011)
  • The IX International Conference and the VIII School for Young Scientists «Silicon 2012» (2012)
  • 11th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP-2012)

Address

Ioffe Physical-Technical Institute,
26 Polytekhnicheskaya,
St. Petersburg, 194021, Russia

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